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IC Front-end testing solutions

Probe Card

Probe Card Service

Probe card is used before IC packing where functional test and electrical property of the wafer will be tested by the probe in order to sort out nonconforming items and avoid the packing of these items, which will add up the cost of packing.

The sophistication of semiconductor products changed quickly for the time being that pushed up the cost of advanced IC packing from time to time and dictated for probe card of the same level of sophistication. For this reason, Keystone Microtech unveiled the high Pin Count, High current rating, high speed and high frequency probe card products to the needs of the customers for their products. These include cell phone processor (AP), power management chip (PMIC), mmWave RF, High Performance Computing (HPC), WiFi Networking and so on. The Company customized the probe card products the individual needs of the customers, which helps to secure many joint venture will several first rate customers with proper verifications domestic and foreign customers.

The probe card service of Keystone Microtech includes the following:

Vertical Probe Card: Cobra

Feature and advantage:

Different peripheral and array combinations
Correspond to high volume output simultaneously
AI Pad testing and Cu Pillar Bump
Applicable the MCU, TDDI., and SOC.
Maximum of 15,000 pin count

Vertical Probe Card: MEMS

Feature and advantage:

Full array combinations
Correspond to high volume output simultaneously
AI Pad testing and Cu Pillar Bump
Low probe force (Min. < 1.7gF)
High current rating (Max. > 1800mA~2800mA)
Low inductance (Min. < 2.5nH)
Maximum of 80,000 pin count
Auto stitching increase production efficiency
All products of advanced process
- High speed interface
  - HDMI
  - MIPI
  - SerDes PAM4
  - USB 4.0
  - PCIe Gen5
- High performance items
  - APU
  - GPU
  - HPC
  - AI chip
  - AP

Keystone Microtech provides full-range and reliable probe card OQC inspection of products. The flying probe tester and manual electrical test of active component, and PRVX4 test. The following diagrams show the Mother Board of different test platforms.